Nd:YLF
CASTECH grows Nd:YLF crystals using Czochralski method. The use of high quality starting materials for crystal growth, whole boule interferometry, and precise inspection of scattering particle in crystal using He-Ne laser assures that each crystal will perform well.
Optical Properties
Transparency Range | 180-6700nm |
Peak Stimulated Emission Cross Section | 1.8×10-19/cm2(E∥c) at 1047nm |
Spontaneous Fluorescence Lifetime | 485 μs for 1% Nd doping |
Scatter Losses | <0.2%/cm |
Peak Absorption Coefficient（for 1.2% Nd） | α= 10.8cm-1 (792.0 nm E∥c) |
Laser Wavelength | 1047nm (∥c, a-cut crystal) |
Physical Properties
Chemical Formula | LiY 1.0-x Nd x F4 |
Space Group | I41/a |
Nd atoms/cm3 | 1.40 X 1020 atoms/cm3 for 1% Nd doping |
Modulus of Elasticity | 85 GPa |
Crystal Structure | Tetragonal |
Cell Parameters | a=5.16 ? , c=10.85 ? |
Melting Point | 819℃ |
Mohs Hardness | 4~5 |
Density | 3.99 g/cm3 |
Thermal Conductivity | 0.063 W/cm/K |
Specific Heat | 0.79 J/g/K |
Thermal Expansion Coefficients | 8.3×10-6/k∥c |
Index of Refraction
Wavelength（nm） | no | ne |
262 | 1.485 | 1.511 |
350 | 1.473 | 1.491 |
525 | 1.456 | 1.479 |
1050 | 1.448 | 1.470 |
2065 | 1.442 | 1.464 |
dn/dT
Wavelength（nm） | E∥c | E⊥c |
436 | -2.44×10-6/℃ | -0.54×10-6/℃ |
578 | -2.86×10-6/℃ | -0.91×10-6/℃ |
1060 | -4.30×10-6/℃ | -2.00×10-6/℃ |
The Sellmeier equations（λ in μm）：
no2=1.38757+0.70757λ2/(λ2-0.00931)+0.18849λ2/(λ2-50.99741)
ne2=1.31021+0.84903λ2/(λ2-0.00876)+0.53607λ2/(λ2-134.9566)
CASTECH’s general Nd:YLF production capabilities including：
? Rod sizes from 2mm to 10mm in diameter and from 1mm to 150mm in length;
? Orientation of rod axis to crystal axis within 1 degree;
? Polished only or AR coated rods;
? Nd dopant concentrations between 0.4 and 1.2at%;
? Large rod and slab dimensions and non-standard dopant concentrations are available upon request.
Specifications
Standard Dopant | 1.1 ± 0.1% |
Wavefront Distortion | <λ/4 per inch @633nm |
Parallelism | <10 ″ |
Perpendicularity | <5 ′ |
Chamfer | 0.13± 0.07mm @45° |
Surface Quality | 10/5 |
End Coating | R<0.15%@1047/1053nm |
Surface Flatness | λ/8 @632.8nm |
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